THôT Testers

• Model 42000 General Specification
• Model 42010 Optical Process Certifier
• Model 42010 Optical Defect Scanner
• Model 42020 Engineering Test System
• Model 42030 Production Optical Process Certifier
• Model 42030 Production Optical Defect Scanner
• Model 42040 Defect Analysis Station
• Model 4238 Spindle and Shaft Tester
• Model 4240 Wafer Inspection System
• Model 4240M Wafer Analysis Station

Optional Features

• Filtered Wavelength Test Option
• Power Spectral Density Option
• Optical Glide / Optical Certification Test Option
• Nano-Scan Test Option
• Runout / Velocity / Acceleration Test Option
• Disk Resonance Test Option
• Thickness Variation Test Option
• Flyability™ Test Adapter
• Disk Drive Test Adapter
• Automated Handler
• Chuck Options

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