Technical Papers

“Nano-Scan Update Report” by THôT Technologies, Inc.
Presentation of the latest developments in Nano-Scan technology - February 2008

“Nano-Scan Report” by THôT Technologies, Inc.
Presentation on the development of Nano-Scan capabilities – September 2007

“Morphology, Flyability and Defects” by Jim Eckerman
Published by Disk Drive Technology Newsletter, July 2007
A presentation of the effects of disk morphology on the fly height modulation of the head-to-disk interface and the consequences of fly height modulation on disk defects.

“Testing for PMR Media” by Dr. Ian Freeman
Presented at Data Storage Institute, Singapore in December 2006
This paper was presented at a Data Storage Institute hosted event sponsored by Marubeni Corporation to discuss the application of laser Doppler vibrometry applications in PMR media evaluation.

“THôT Photonic Force Microscope, Model 42000” by Marubeni Corporation.
Presented at DiskCon, Japan in April 2006
A presentation of the capabilities of the new THôT Model 42000 full surface “Photonic Force Microscope”

“An Introduction to the Theory of Laser Vibrometry” by David Oliver
Presented at a Polytec seminar in Santa Clara in March 2006
This is an introduction to the basics and theory of laser Doppler vibrometry measurement.

“Targeting the Limits of Laser Doppler Vibrometry” by Martin Johansmann, Georg Siegmund and Mario Pineda
Presented at IDEMA, Japan in October 2005
A discussion of the limits of measurement by laser Doppler vibrometry by theory and measurement.

“The Dynamics of Surface Curvature and the Head-to-Disk Interface” by Jim Eckerman and Dr. James Chao
Published in IDEMA Insight Magazine in May 2004
A discussion of the dynamics of the disk, the distortions that occur in use and the effect on the head-to-disk interface, importantly, the fly height modulation.

“Higher Density, Higher Performance” by Jim Eckerman.
Published by Polytec in February 2004
In the hard disk drive segment of the data storage industry, the challenges to understand the mechanical interactions are extreme as the fight for micro-inch control has progressed to nano-meters, Angstroms and now to understanding tenths of Angstroms.

“Scatered Thoughts” by Steven Miller, Breault Research.
Published in SPIE’s OE Magazine in January 2004
A discussion of scatter technology, design considerations and limitations.

“The Next Generation of Dynamic Rotational Testers” by Jim Eckerman
Presented at an IDEMA Technical Conference in 2003
This paper describes laser Doppler vibrometry applied to making single point spindle measurements with extreme accuracy for synchronous and non-synchronous error motions in both axial and radial planes and a method of examining total body motion.

“THôT Photonic Force Microscope for Disks” by Dr. Ian Freeman and Jeff Aufderheide
Published in Insight Magazine by IDEMA in July 2003.
This paper provides an analysis of the various methods of disk surface morphology and defect measurements with a discussion of the advantages and disadvantages of each.

“LDV Based Disk Measurement Instruments” by THôT Technologies, Inc.
Presented at DiskCon in 2003
A slide show of presentation information demonstrating the various aspects of laser Doppler vibrometry measurements.

“Calibration of Step Heights and Roughness Measurements with Atomic Force Microscopes” by J. Garnaes, N. Kofod, A. Kuhle, C. Nielsen, K. Dirscherl and L. Blunt.
Published by Precision Engineering Magazine in August 2002
An extensive study of the calibration of Atomic Force Microscopes for height measurements and roughness.

“Predicting Glide Height Avalanche Performance” by Jeff Aufderheide.
Presented at an IDEMA Technical Conference in 2002
This paper presents data on the ability to predict Glide Height Avalanche performance using an LDV to measure defects and surface morphology.

“The Effects of Disk Morphology on Flying-Height Modulation” by Brian Thornton, Prof. David Bogy and C.S. Bhatia
Published by IEEE in 2001
This paper was written at the University of California at Berkeley and discusses how the disk morphology affects the flying characteristics of the head.

“Technology for the 21st Century” by Dr. Ian Freeman and Jeff Aufderheide.
Presented at the DiskCon Technical Conference in 2000.
Surface morphology, defects and dynamics, measured by laser Doppler vibrometry are all discussed in the paper.

“Laser Measurements” by Dr. Ian Freeman.
Published in Data Tech Magazine, Fourth Quarter, 1998.
A presentation of comparisons between scatterometry, elipseometry, interferometry and vibrometry and their applications within the disk and disk drive industry.

“A Short Review of Current Optical Test Technology” by Jim Eckerman
Presented at The Head and Media Technology Review, Las Vegas, Nevada in 1997.
As the title states, this paper is a look at current laser Doppler vibrometry test technology.

“Dynamic Optical Metrology for Production” by Dr. Ian Freeman and Jim Eckerman.
Presented at The Head and Media Technology Review, Las Vegas, Nevada in 1996.
A discussion of the potential application of laser measurement technology to all phases of disk production.

“Laser Based Test Technology” by Dr. Ian Freeman.
Presented at The Head and Media Technology Review, Las Vegas, Nevada in 1995.
This paper discusses the potential applications of LDV technology in the examination of substrates, finished media and various aspects of the disk drive.

“Mechanical Measurements – µ-Waviness, A Unique Approach” by Dr. Ian Freeman.
Presented at the DiskCon Technical Conference in 1993.
A graphic demonstration of laser Doppler vibrometry measurement of disk surface distortions.

“A Study of Disk Flatness and Clamping Distortion using Doppler Laser Vibrometry” by Dr. Ian Freeman and Jim Eckerman.
Presented at the DiskCon Technical Conference in 1992.
Variations in disk flatness under clamping pressures are highly dependent on the condition of the clamping area topography.

“A Comparison of Laser and Capacitive Probe Testing” by Dr. Ian Freeman.
Presented at an IDEMA standards conference in 1992.
This paper compares laser Doppler measurement techniques to capacitance probes and addresses the advantages of LDV technology for signal-to-noise, standoff distance, accuracy and the ability to measure a variety of materials.

 

 

 

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